DocumentCode :
3293520
Title :
Deposition of diamond films on SiO2 surface using high power microwave enhanced chemical vapor deposition process
Author :
Lee, Jau-Sung ; Liu, Kuo-Shung ; Lin, I-Nan
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
1996
fDate :
7-12 Jul 1996
Firstpage :
436
Lastpage :
440
Abstract :
Diamonds were successfully nucleated on SiO2-coated silicon substrates using high power microwave plasma enhanced chemical vapor deposition (CVD) process. Nucleation rate on SiO2 surface (i.e., 0.5×1010 cm-2) is, however, still smaller than that on Si surface (i.e., 1.0×1010 cm-2). The growth of diamonds behaved similarly on the pre-nucleated surface, regardless of the nature of the substrates. Diamonds were of single grain columnar structure with random orientation when deposited without bias and were of multigrain columnar structure with [001] preferred orientation when deposited under -100 VDC bias. Multigrain columnar structure was ascribed to the induction of secondary nucleation at the presence of bias voltage
Keywords :
diamond; elemental semiconductors; nucleation; plasma CVD; plasma CVD coatings; semiconductor thin films; silicon compounds; substrates; -100 V; C-SiO2; SiO2; SiO2 surface; [001] preferred orientation; bias voltage; chemical vapor deposition process; diamond films; high power microwave PECVD; multigrain columnar structure; nucleation rate; plasma enhanced CVD; secondary nucleation; single grain columnar structure; Chemicals; Plasma chemistry; Plasma temperature; Scanning electron microscopy; Silicon; Surface contamination; Surface morphology; Transmission electron microscopy; Voltage; Wounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
Conference_Location :
St. Petersburg
Print_ISBN :
0-7803-3594-5
Type :
conf
DOI :
10.1109/IVMC.1996.601859
Filename :
601859
Link To Document :
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