• DocumentCode
    3293534
  • Title

    A methodology to assess the impact of optical and electronic crosstalk in a new generation of sensors using heritage data

  • Author

    Oudrari, Hassan ; Schwarting, Thomas ; Chiang, Kwo-Fu ; McIntire, Jeff ; Pan, Chunhui ; Xiong, Xiaoxiong ; Butler, James

  • Author_Institution
    Sigma Space Corp., Lanham, MD, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    2691
  • Lastpage
    2694
  • Abstract
    Electronic and optical crosstalk are radiometric challenges that often exist in the focal plane design in many sensors such as MODIS. A methodology is described to assess the impact due to optical and electronic crosstalk on the measured radiance, and thereafter, the retrieval of geophysical products using MODIS Level 1 data sets. Based on a postulated set of electronic and optical crosstalk coefficients, and a set of MODIS scenes, we have simulated a system signal contamination on any detector on a focal plane when another detector on that focal plane is stimulated with a geophysical signal. The original MODIS scenes and the crosstalk impacted scenes can be used with validated geophysical algorithms to derive the final data products. Products contaminated with crosstalk are then compared to those without contamination to assess the impact magnitude and location, and will allow us to separate Out-Of-Band (OOB) leaks from band-to-band optical crosstalk, and identify potential failures to meet climate research requirements.
  • Keywords
    focal planes; optical crosstalk; sensors; MODIS Level 1 data sets; band-to-band optical crosstalk; electronic crosstalk; focal plane design; geophysical products; heritage data; out-of-band leaks; sensors; system signal contamination; Contamination; Crosstalk; Detectors; MODIS; Optical crosstalk; Optical sensors; MODIS; characterization; crosstalk; environmental products; performance; sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5649196
  • Filename
    5649196