Title :
Structured fault-detection and diagnosis using finite-state automaton
Author :
Ramkumar, K.B. ; Philips, Patrick ; Presig, Heinz A. ; Ho, W.K. ; Lim, K.W.
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
fDate :
31 Aug-4 Sep 1998
Abstract :
Fault detection and diagnosis in large, complex dynamic systems is important for safe operation. Faults may occur in the process, the sensors, the actuators and the measuring instruments independently or simultaneously. Some faults can be detected by direct measurement, but many can only be inferred through indirect means. We propose to address the problem of fault-detection and diagnosis using finite-state automaton models (FAM). These models partition the state-space into finite regions and contain information on system trajectory within these regions. A framework for modelling faults using FAM is discussed. A fault-detection engine is then developed to detect and isolate faults
Keywords :
discrete event systems; fault diagnosis; fault location; finite automata; large-scale systems; process control; state-space methods; actuator faults; discrete event system; fault detection; fault isolation; fault-detection engine; finite-state automaton models; large complex dynamic systems; measuring instrument faults; process control; process faults; process plant; safe operation; sensor faults; state-space partitioning; structured fault diagnosis; structured fault-detection; supervisory control; Artificial neural networks; Automata; Diagnostic expert systems; Electrical fault detection; Extraterrestrial measurements; Fault detection; Fault diagnosis; Instruments; Mathematical model; Redundancy;
Conference_Titel :
Industrial Electronics Society, 1998. IECON '98. Proceedings of the 24th Annual Conference of the IEEE
Conference_Location :
Aachen
Print_ISBN :
0-7803-4503-7
DOI :
10.1109/IECON.1998.722923