DocumentCode
3293770
Title
Configurable PVC checking for fault identification
Author
Ng, W. ; Jacobson, S. ; Nguyen, D. ; Shen, S.
Author_Institution
Nat. Semicond., Santa Clara, CA, USA
fYear
2009
fDate
6-10 July 2009
Firstpage
493
Lastpage
497
Abstract
This paper describes a configurable passive voltage contrast (PVC) checker for fault identification. The checker uses an on-line trace technique to query connectivity of design layout features downward, and color coded the checked features according to pre-defined terminations. The checker was used for fault identification on a scan based design. The emulated PVC behavior expedites comparison to scanning electron microscope (SEM) images shortening the time for fault localization.
Keywords
fault diagnosis; integrated circuit testing; configurable PVC checking; fault identification; online trace technique; passive voltage contrast checker; scan based design; Electrostatic discharge; Failure analysis; Fault diagnosis; Integrated circuit modeling; Power engineering and energy; Protection; RLC circuits; Robustness; Stress; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
Conference_Location
Suzhou, Jiangsu
ISSN
1946-1542
Print_ISBN
978-1-4244-3911-9
Electronic_ISBN
1946-1542
Type
conf
DOI
10.1109/IPFA.2009.5232599
Filename
5232599
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