Title :
Configurable PVC checking for fault identification
Author :
Ng, W. ; Jacobson, S. ; Nguyen, D. ; Shen, S.
Author_Institution :
Nat. Semicond., Santa Clara, CA, USA
Abstract :
This paper describes a configurable passive voltage contrast (PVC) checker for fault identification. The checker uses an on-line trace technique to query connectivity of design layout features downward, and color coded the checked features according to pre-defined terminations. The checker was used for fault identification on a scan based design. The emulated PVC behavior expedites comparison to scanning electron microscope (SEM) images shortening the time for fault localization.
Keywords :
fault diagnosis; integrated circuit testing; configurable PVC checking; fault identification; online trace technique; passive voltage contrast checker; scan based design; Electrostatic discharge; Failure analysis; Fault diagnosis; Integrated circuit modeling; Power engineering and energy; Protection; RLC circuits; Robustness; Stress; Testing;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
Conference_Location :
Suzhou, Jiangsu
Print_ISBN :
978-1-4244-3911-9
Electronic_ISBN :
1946-1542
DOI :
10.1109/IPFA.2009.5232599
