• DocumentCode
    3293836
  • Title

    A dual-mode thickness-shear quartz pressure sensor

  • Author

    Besson, R.J. ; Boy, J.J. ; Glotin, B. ; Jinzaki, Y. ; Sinha, B.K. ; Valdois, M.

  • Author_Institution
    ENSMM, Besancon, France
  • fYear
    1991
  • fDate
    8-11 Dec 1991
  • Firstpage
    485
  • Abstract
    Performance requirements from pressure and temperature sensors especially for use in oil fields are very demanding. Several years of effort have been devoted to the development of a dual-mode thickness-shear quartz pressure sensor to meet such requirements. The objective of this effort was to develop a sensor with a pressure range of up to 15000 psi, a temperature range of up to 175°C, a pressure calibration accuracy of 1 psi, and a resolution of 0.01 psi with 1-s counter gate time. It is demonstrated that the dual-mode thickness-shear quartz pressure sensor presented meets or exceeds these requirements. The pressure resolution is better than 0.01 psi at 1-s counter gate time. A significant advantage of the dual-mode design is its dynamic performance. An in situ measurement of the resonator temperature allows an implementation of an extremely effective dynamic compensation algorithm which yields corrected pressure readings with a response time as short as a strain-gauge-based pressure transducer while retaining the high performance of a quartz gauge under static conditions
  • Keywords
    crystal resonators; electric sensing devices; pressure measurement; pressure sensors; dual-mode thickness-shear quartz pressure sensor; dynamic compensation algorithm; dynamic performance; oil fields; pressure calibration accuracy; quartz resonator; resolution; resonator temperature; response time; static conditions; temperature sensors; Calibration; Counting circuits; Delay; Heuristic algorithms; Petroleum; Pressure measurement; Temperature distribution; Temperature sensors; Time measurement; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1991. Proceedings., IEEE 1991
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1991.234213
  • Filename
    234213