• DocumentCode
    3293950
  • Title

    In-situ observation and formation mechanism of aluminum voiding

  • Author

    Sugano, Y. ; Minegishi, S. ; Sumi, H. ; Itabashi, M.

  • Author_Institution
    Sony Corp., Atsugi, Japan
  • fYear
    1988
  • fDate
    12-14 Apr 1988
  • Firstpage
    34
  • Lastpage
    38
  • Abstract
    An in situ observation equipment was used to investigate aluminum void formation. It was found that the voids are formed during heating and are hardly changed during cooling. The void growth can be described by an equation in which the total number of voids saturates to a certain value as a function of heating time. The passivation swelling as a causative mechanism was confirmed with an actual trace of the material´s surface and by a finite-element simulation
  • Keywords
    aluminium; metallisation; passivation; reliability; voids (solid); Al; Al void formation; finite-element simulation; heating; in situ observation; interconnection; passivation swelling; void growth; Aluminum; Cooling; Equations; Finite element methods; Heating; Optical films; Optical microscopy; Optical recording; Passivation; Silicon compounds; Temperature; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium 1988. 26th Annual Proceedings., International
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/RELPHY.1988.23422
  • Filename
    23422