• DocumentCode
    3294038
  • Title

    Impact of simulation parameters on critical area analysis

  • Author

    Segal, Julie ; Bakarian, Sergei ; Ross, Ron

  • Author_Institution
    HPL Inc., San Jose, CA, USA
  • fYear
    1999
  • fDate
    36465
  • Firstpage
    14
  • Lastpage
    19
  • Abstract
    Monte Carlo critical area extraction routines are controlled by a number of parameters that impact the accuracy and speed of the simulation. In this paper, the effects of the following parameters are explored experimentally: defect shape, rounding of corners in the layout, merging of redundant contacts, consideration of the netlist extracted from layout, and varying the number of defects simulated
  • Keywords
    Monte Carlo methods; circuit layout CAD; circuit simulation; integrated circuit layout; integrated circuit yield; redundancy; Monte Carlo extraction routines; corner rounding; critical area analysis; defect shape; netlist; redundant contacts; simulation accuracy; simulation parameters; simulation speed; Analytical models; Data mining; Geometry; Instruments; Integrated circuit layout; Integrated circuit yield; Merging; Radio access networks; Random access memory; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1999. DFT '99. International Symposium on
  • Conference_Location
    Albuquerque, NM
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-0325-x
  • Type

    conf

  • DOI
    10.1109/DFTVS.1999.802864
  • Filename
    802864
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3294038