A new method to optimize function verification

In present, due to increasing complexity and scale of digital design, verification efficiency, coverage and reusability have been aspects that people care about most. In practical verification of EMI (External Memory Interface), we accumulate many experiences and conclude some rules. Based on these experiences and rules, a new method to optimize is proposed in this paper. From verification results, we prove that verification time is evidently shortened, all function points are covered and the testbench is reusable.