Title :
Framework for Event Driven Sorter Operation
Author :
Tamehiro, Ryuji ; Herbold, Barry M. ; Gartland, Karl E. ; Liang, Frank
Author_Institution :
IBM Japan Ind. Solution Co. Ltd., Kyoto
Abstract :
Recently most manufacturing operations in FAB are done in automated manner. Following the predefined process routing information, every lot is automatically dispatched, transported, and processed by manufacturing execution system (MES). However all kinds of wafer sorting operation cannot be predefined in the route because unplanned wafer sorting is required according to the process result, condition of process equipment, or other reason. This paper describes concerns to automate sorter operation and proposes the framework to cover both planned and unplanned sorter operation in the same automated manner with event driven base.
Keywords :
electronics industry; factory automation; integrated circuit manufacture; materials handling; semiconductor technology; event driven sorter operation; manufacturing execution system; process routing information; sorter operation automation; wafer sorting operation; Automatic control; Control systems; Dispatching; Information retrieval; Manufacturing automation; Manufacturing industries; Manufacturing processes; Process control; Routing; Sorting;
Conference_Titel :
Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-4-9904138-0-4
DOI :
10.1109/ISSM.2006.4493076