Title :
Productivity Improvement by Integrated Management of Wafer Map Data
Author :
Takesako, Norihiro ; Terada, Yuka
Abstract :
Utilization of proprietary wafer map data has yet been prevalent and forcing us to spend huge amount of cost and time on system development for outsource fabrication factory data transmission. We have developed the system that is able to centralized control of wafer map data by the SEMI compliant DB to reduce development cost and time. It has also been contributing to reduce yield decline and production delay caused by map data related malfunctions.
Keywords :
cost reduction; wafer level packaging; centralized control; integrated management; outsource fabrication factory data transmission; production delay; productivity improvement; wafer map data; Assembly; Centralized control; Control systems; Costs; Data communication; Fabrication; Ink; Inspection; Production facilities; Productivity;
Conference_Titel :
Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-4-9904138-0-4
DOI :
10.1109/ISSM.2006.4493077
