Title :
Texture analysis using multiresolution moments
Author :
Swarnakar, Vivek ; Acharya, Raj
Author_Institution :
Dept. of Radiol., California Univ., San Francisco, CA, USA
Abstract :
A new family of scale, rotation and affine transformation invariant parameters, denoted as multiresolution moments, is introduced. The basic underlying theory of this generalized and extensible family is described. Experimental results obtained by using a specific subset of this family of new parameters towards texture similarity measurement are included to illustrate the applicability and robustness of this family of parameters
Keywords :
image representation; image resolution; image texture; affine transformation invariant parameters; multiresolution moments; rotation; scale; texture analysis; texture similarity measurement; Computational modeling; Distribution functions; Image texture; Image texture analysis; Mathematical model; Polynomials; Q measurement; Radiology; Robustness;
Conference_Titel :
Image Processing, 1998. ICIP 98. Proceedings. 1998 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
0-8186-8821-1
DOI :
10.1109/ICIP.1998.723412
