Title :
Implementing a self-checking neural system for photon event identification by SRAM-based FPGAs
Author :
Alderighi, Monica ; D´Angelo, Sergio ; Piuri, Vincenzo ; Sechi, Giacomo R.
Author_Institution :
Inst. di Fisica Cosmica, CNR, Milano, Italy
Abstract :
The paper presents and evaluates the design and the implementation of a self-checking neural system for photon event identification in intensified charge-coupled device detectors. The neural approach reveals more effective than classical algorithmic approaches thanks to its learning through example ability. Implementation is accomplished by SRAM-based FPGAs, which have generated increasing interest in the space community. The adoption of suitable on-line fault detection techniques is illustrated taking into account in a specific way SEU induced faults. The techniques are based on AN coding, particularly 3N coding, which constitutes a reasonable trade-off between circuit complexity and computational delay. Estimations of circuit area overhead and fault coverage are reported
Keywords :
CCD image sensors; delays; fault diagnosis; field programmable gate arrays; learning by example; neural chips; space vehicle electronics; 3N coding; AN coding; SEU induced faults; SRAM-based FPGAs; circuit area overhead; circuit complexity; computational delay; fault coverage; intensified charge-coupled device detectors; learning through example; on-line fault detection techniques; photon event identification; self-checking neural system; space community; Artificial neural networks; Charge coupled devices; Circuit faults; Complexity theory; Detectors; Event detection; Field programmable gate arrays; Image storage; Signal processing algorithms; Single event upset;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1999. DFT '99. International Symposium on
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7695-0325-x
DOI :
10.1109/DFTVS.1999.802894