DocumentCode
3294798
Title
A methodology for efficient simulation and diagnosis of mixed-signal systems using error waveforms
Author
Cherubal, Sasikumar ; Chatterjee, Abhijit
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
fYear
1999
fDate
36465
Firstpage
357
Lastpage
365
Abstract
In this paper we present a novel approach for fast fault simulation of digital faults in mixed-signal systems without resorting to expensive mixed-signal simulation for every fault. The approach is based on partitioning the mixed-signal circuit and representing digital fault effects using error waveforms. We propose methods to compress a large number of digital fault effects into a few fault syndromes. This results in significant savings in fault simulation effort. We demonstrate the ability to differentiate fault syndromes of different partitions of the circuit
Keywords
fault diagnosis; fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; multichip modules; circuit partitioning; diagnosis methodology; digital fault effects; digital faults simulation; error waveforms; fast fault simulation; fault effects compression; fault syndromes; mixed-signal systems; simulation methodology; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Codecs; Costs; Digital circuits; Manufacturing; Packaging; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1999. DFT '99. International Symposium on
Conference_Location
Albuquerque, NM
ISSN
1550-5774
Print_ISBN
0-7695-0325-x
Type
conf
DOI
10.1109/DFTVS.1999.802903
Filename
802903
Link To Document