• DocumentCode
    3294798
  • Title

    A methodology for efficient simulation and diagnosis of mixed-signal systems using error waveforms

  • Author

    Cherubal, Sasikumar ; Chatterjee, Abhijit

  • Author_Institution
    Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1999
  • fDate
    36465
  • Firstpage
    357
  • Lastpage
    365
  • Abstract
    In this paper we present a novel approach for fast fault simulation of digital faults in mixed-signal systems without resorting to expensive mixed-signal simulation for every fault. The approach is based on partitioning the mixed-signal circuit and representing digital fault effects using error waveforms. We propose methods to compress a large number of digital fault effects into a few fault syndromes. This results in significant savings in fault simulation effort. We demonstrate the ability to differentiate fault syndromes of different partitions of the circuit
  • Keywords
    fault diagnosis; fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; multichip modules; circuit partitioning; diagnosis methodology; digital fault effects; digital faults simulation; error waveforms; fast fault simulation; fault effects compression; fault syndromes; mixed-signal systems; simulation methodology; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Codecs; Costs; Digital circuits; Manufacturing; Packaging; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1999. DFT '99. International Symposium on
  • Conference_Location
    Albuquerque, NM
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-0325-x
  • Type

    conf

  • DOI
    10.1109/DFTVS.1999.802903
  • Filename
    802903