DocumentCode
3294808
Title
Reconfiguration of one-time programmable FPGAs with faulty logic resources
Author
Feng, Wenyi ; Chen, Xiaotao ; Meyer, Fred J. ; Lombardi, Fabrizio
Author_Institution
Lucent Technol., Allentown, PA, USA
fYear
1999
fDate
36465
Firstpage
368
Lastpage
376
Abstract
A comprehensive approach is given to reconfigure field programmable gate arrays (FPGAs) with faults in the logic resources. Reconfiguration consists of a reassignment of the cells that takes into account the one-time programmable nature of the chip resources. The method alters neither the FPGA nor the fault-free design; so the effectiveness of the reassignment depends on the efficient use of routing resources in the fault-free design. Under a generalized architecture, the spare routing resources needed are obtained to bypass each faulty cell and reassign its functions to a spare (unused) cell. If every channel has as many spare trades as half the number of logic cell inputs and outputs, then any single faulty cell can be reassigned, thus yielding a successful chip reconfiguration. The proposed reassignment algorithm has an efficient execution, so it can be run while chips are programmed and tested on an assembly line. The number of calls to the routing software is at worst quadratic in the number of faulty cells, provided no backtracking is needed in the reassignment. Under some randomness assumptions, the average number of calls to the routing software is linear in the number of faulty cells. The proposed method is analyzed with benchmark circuits and simulation results are presented
Keywords
circuit layout CAD; field programmable gate arrays; integrated circuit layout; logic CAD; network routing; FPGA reconfiguration; cell reassignment; faulty logic resources; field programmable gate arrays; one-time programmable FPGAs; reassignment algorithm; spare routing resources; Analytical models; Assembly; Circuit analysis; Circuit faults; Circuit simulation; Field programmable gate arrays; Programmable logic arrays; Reconfigurable logic; Routing; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1999. DFT '99. International Symposium on
Conference_Location
Albuquerque, NM
ISSN
1550-5774
Print_ISBN
0-7695-0325-x
Type
conf
DOI
10.1109/DFTVS.1999.802904
Filename
802904
Link To Document