• DocumentCode
    3294919
  • Title

    BIST Testability Enhancement Using High Level Test Synthesis Techniques

  • Author

    Lai, Kowen ; Papachristou, Christos A. ; Baklashov, Mikhail

  • fYear
    1997
  • fDate
    3-5 June 1997
  • Firstpage
    359
  • Lastpage
    365
  • Keywords
    Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Design for testability; Digital signal processing; High level synthesis; Semiconductor device testing; Signal synthesis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
  • Conference_Location
    Taipei, Taiwan
  • ISSN
    1524-766X
  • Print_ISBN
    0-7803-4131-7
  • Type

    conf

  • DOI
    10.1109/VTSA.1997.614936
  • Filename
    614936
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3294919