Title :
BIST Testability Enhancement Using High Level Test Synthesis Techniques
Author :
Lai, Kowen ; Papachristou, Christos A. ; Baklashov, Mikhail
Keywords :
Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Design for testability; Digital signal processing; High level synthesis; Semiconductor device testing; Signal synthesis; System testing;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-4131-7
DOI :
10.1109/VTSA.1997.614936
