Title :
Three zone-reactive wetting ring structure at interface between lead-free Sn-Ag-Cu solder and Ni pad
Author :
Xiaoqing, Li ; Fai, Lam Tim
Author_Institution :
Spansion (China) Ltd., Suzhou, China
Abstract :
The wetting behavior of Sn-Ag-Cu solder ball on nickel pad has been studied. SEM and EDX were employed to analyze the solder joint interfacial microstructure. Three zone-reactive wetting ring structure was found at the interface. To further study this kind of structures, solder ball attachment (SBA) and surface mount technology (SMT) were performed to prepare more samples. Experimental results show that the reactive wetting ring is a characteristic of wetting behavior of Sn-Ag-Cu solder ball on Ni or Cu pad. It forms in ball attach reflow and sometimes can remain after SMT. A model was proposed to illustrate the three zone structure. Effects of the reactive wetting ring on the joint adhesion quality are discussed in this paper.
Keywords :
X-ray chemical analysis; adhesion; chemical interdiffusion; copper; copper alloys; interface structure; nickel; reflow soldering; scanning electron microscopy; silver alloys; solders; surface mount technology; tin alloys; wetting; Cu; EDX; Ni; SEM; SnAgCu-Ni; adhesion; ball attach reflow; intermetallic compounds; older ball attachment; solder ball-nickel pad interface; solder joint interfacial microstructure; surface mount technology; three zone-reactive wetting ring structure; Adhesives; Copper; Environmentally friendly manufacturing techniques; Intermetallic; Lead; Microstructure; Nickel; Optical microscopy; Soldering; Surface-mount technology;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
Conference_Location :
Suzhou, Jiangsu
Print_ISBN :
978-1-4244-3911-9
Electronic_ISBN :
1946-1542
DOI :
10.1109/IPFA.2009.5232663