DocumentCode :
3295072
Title :
On the capacitance of vacuum microelectronic devices with different field emitter shapes
Author :
Wang, Baoping ; Tang, Yongming ; Sin, Johnny K O ; Poon, Vincent M C
Author_Institution :
Dept. of Electron. Eng., Southeast Univ., Nanjing, China
fYear :
1996
fDate :
7-12 Jul 1996
Firstpage :
509
Lastpage :
513
Abstract :
In this paper, capacitance of diode vacuum microelectronic devices with different field emitter shapes are studied. By using finite difference method, electric field and capacitance of field emitters with five different shapes are calculated. Calculation results show that the emitter shape has a larger effect on the field enhancement than on the capacitance. When the anode diameter is decreased from 8 μm to 4 μm, the capacitance can be decreased by ten times for the sharp tip-on-post field emitter. When the distance between the cathode and the anode and the height of the field emitter are increased by 2 μm, the capacitance can be increased by about 30% for the sharp tip-on-post field emitter
Keywords :
anodes; capacitance; electric fields; finite difference methods; vacuum microelectronics; 4 micron; anode diameter; capacitance; diode vacuum microelectronic devices; electric field; field emitter shapes; field enhancement; finite difference method; tip-on-post field emitter; Anodes; Capacitance; Cathodes; Diodes; Finite difference methods; Microelectronics; Radio frequency; Shape; Silicon compounds; Structural engineering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
Conference_Location :
St. Petersburg
Print_ISBN :
0-7803-3594-5
Type :
conf
DOI :
10.1109/IVMC.1996.601875
Filename :
601875
Link To Document :
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