DocumentCode
3295127
Title
Exploitation of massive numbers of simple events
Author
Rimey, Ray ; Keefe, Dan
Author_Institution
IS & GS, Advanced Technol. Oper. (ATO), Lockheed Martin, Bethesda, MD
fYear
2008
fDate
15-17 Oct. 2008
Firstpage
1
Lastpage
6
Abstract
Emerging image-based sensor systems can observe a relatively large area (e.g., the size of an urban neighborhood) for long time intervals either continually or with high revisit rates. This type of sensor data makes new types of exploitation possible, but only with the assistance of automated exploitation aids because of the massive volume of data that must be studied as a whole. Automated methods to extract the simplest events from image sequences are often fairly robust (e.g., change events derived from EO or SAR image sequences or from video-derived tracks). Massive numbers of such events can contain information with high intelligence value. This paper examines this general-purpose problem: How massive numbers of the simplest sensor-derived events can be exploited. We summarize the basic functionality an intelligence analyst needs for studying this type of event data, in short: to understand the spatial structure, temporal structure and event-pair structure within an area of regard. Then we present a number of algorithms for automated exploitation of such data, and some visualization tools to help analysts study such data. Experimental results using all those technologies are also presented.
Keywords
data visualisation; image sequences; temporal databases; visual databases; automated exploitation aids; data visualization tools; event-pair structure; image sequences; image-based sensor systems; intelligence analyst; massive numbers; sensor data; simple events; simplest sensor-derived events; spatial structure; temporal structure; Algorithm design and analysis; Data analysis; Data mining; Data visualization; Image sequences; Intelligent sensors; Intelligent structures; Robustness; Sensor systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Imagery Pattern Recognition Workshop, 2008. AIPR '08. 37th IEEE
Conference_Location
Washington DC
ISSN
1550-5219
Print_ISBN
978-1-4244-3125-0
Electronic_ISBN
1550-5219
Type
conf
DOI
10.1109/AIPR.2008.4906460
Filename
4906460
Link To Document