DocumentCode :
3295146
Title :
Monte Carlo Simulation of SiOx Layers Annealing
Author :
GIadkih, N.A. ; Shwartz, Nataliya L. ; Yanovitskaja, Zoya Sh ; Zverev, Alexey V.
Author_Institution :
Novosibirsk State Tech. Univ., Novosibirsk
fYear :
2007
fDate :
June 1 2007-July 5 2007
Firstpage :
40
Lastpage :
44
Abstract :
Monte Carlo model of SiOx layers annealing and growth was developed. Model layers of stoichiometric SiO2 with initially randomly distributed components on partially filled diamond-like lattice tends to SiO4 tetrahedron formation during high-temperature annealing. Chains of tetrahedrons are found to be connected by oxygen atom. Portion of properly coordinated atoms was up to 70%. Presence of excess silicon in SiOx layers results in increasing of the portion of properly coordinated oxygen atoms (up to 95%). Starting from 17% of excess silicon nc-Si were created in annealed layer. MC simulation of initial stages of SiO2 growth during dry oxidation of atomically clean Si(111) surface was carried out taking into consideration silicon monoxide formation and decomposition.
Keywords :
Monte Carlo methods; oxidation; rapid thermal annealing; silicon compounds; Monte Carlo simulation; SiO2; SiO2 interface; SiO4; SiO4 interface; diamond-like lattice; dry oxidation; high-temperature annealing; randomly distributed components; semiconductor layers annealing; tetrahedron formation; Atomic layer deposition; Computational modeling; Conferences; Lattices; Monte Carlo methods; Nanocrystals; Oxidation; Physics; Silicon compounds; Simulated annealing; SiOx layer; nanocluster; simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Materials, 2007. EDM '07. 8th Siberian Russian Workshop and Tutorial on
Conference_Location :
Erlagol, Altai
ISSN :
1815-3712
Print_ISBN :
978-5-7782-0752-3
Type :
conf
DOI :
10.1109/SIBEDM.2007.4292902
Filename :
4292902
Link To Document :
بازگشت