Title :
Monitor Cost Reduction Through Application of Activity Based Costing
Author :
Li, Chih-Wei Jeremy ; Cheng, C.M.
Author_Institution :
Taiwan Semicond. Manuf. Co., Ltd., Tainan
Abstract :
Wafer fabrication is the most complex process with high cost down pressure industry. Therefore, finding a precise cost model for monitor expense and then setting up a monitor cost reduction mechanism will be very critical for wafer fabrication operation field. This article will introduce a monitor cost model using activity based costing, which has became the manufacturing strategy for monitor reduction. Meanwhile, couples of applications will base on this article monitor reduction mechanism to reduce monitor expense.
Keywords :
cost reduction; integrated circuit manufacture; process monitoring; substrates; activity based costing; cost model; monitor cost reduction; wafer fabrication; Automatic control; Chemicals; Condition monitoring; Control systems; Costing; Costs; Equations; Raw materials; Recycling; Semiconductor device modeling;
Conference_Titel :
Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-4-9904138-0-4
DOI :
10.1109/ISSM.2006.4493145