DocumentCode
3295405
Title
Effects of radiation on digital architectures: one year results from a satellite experiment
Author
Velazco, R. ; Cheynet, P. ; Ecoffet, R.
Author_Institution
Lab. TIMA, Grenoble, France
fYear
1999
fDate
2-2 Oct. 1999
Firstpage
164
Lastpage
169
Abstract
Twenty-four experiments on-board a scientific satellite, successfully launched by Naval Research Laboratories, are operating in a high radiation environment since November 1997. Two of these experiments, designed by TIMA in collaboration with CNES (French Space Agency) were programmed to provide evidences of Artificial Neural Network intrinsic fault tolerance properties. This paper presents conclusions issued of the analysis of more than one year telemetred data.
Keywords
digital integrated circuits; fault tolerant computing; integrated circuit reliability; neural chips; radiation effects; redundancy; ANN intrinsic fault tolerance properties; artificial neural network; digital architectures; high radiation environment; radiation effects; satellite experiment; scientific satellite; telemetred data analysis; Artificial neural networks; Computer architecture; Emulation; Fault tolerance; Hardware; Neurons; Parallel processing; Physics computing; Satellites; Signal processing algorithms;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuits and Systems Design, 1999. Proceedings. XII Symposium on
Conference_Location
Natal, Brazil
Print_ISBN
0-7695-0387-X
Type
conf
DOI
10.1109/SBCCI.1999.803112
Filename
803112
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