Title :
Research of Substrate Carrier Injection Mechanism in Digital Integrated Elements
Author :
Krupkina, Tatyana Y. ; Rodionov, Denis V.
Author_Institution :
Moscow State Inst. of Electron. Eng., Moscow
fDate :
June 1 2007-July 5 2007
Abstract :
In this paper substrate carrier injection mechanism and related effects were explored for single device and simple digital element.
Keywords :
digital integrated circuits; elemental semiconductors; numerical analysis; substrates; digital integrated elements; numerical simulation; single device; substrate carrier injection mechanism; substrate noise; Active noise reduction; Fluctuations; Integrated circuit noise; Integrated circuit technology; MOS devices; MOSFETs; Resistors; Semiconductor device noise; Semiconductor diodes; Substrates; injection machanism; numerical simulation; substrate niose;
Conference_Titel :
Electron Devices and Materials, 2007. EDM '07. 8th Siberian Russian Workshop and Tutorial on
Conference_Location :
Erlagol, Altai
Print_ISBN :
978-5-7782-0752-3
DOI :
10.1109/SIBEDM.2007.4292920
