DocumentCode :
3295435
Title :
The Research of Ways of Increase of Sensitivity of Magnetotransistor by Numerical Methods
Author :
Kozlov, Anton V. ; Parmenov, Yurij A.
Author_Institution :
Moscow State Inst. of Electron. Eng. (Techn. Univ.), Moscow
fYear :
2007
fDate :
June 1 2007-July 5 2007
Firstpage :
93
Lastpage :
96
Abstract :
By means of numerical modeling research of structure dual-collector bipolar magnetosensitivity n-p-n transistor in diffusion well of p-type with topology of elements: the emitter-base-collector was carried out. The analysis of proceeding currents through electrodes of the transistor has shown that relative magnetic sensitivity has a negative range. It is carried out research of influence of control voltage between electrodes of the transistor on change of a sign and size relative current sensitivity. The factors leading increase of magnetic sensitivity of transistors and change of a sign of a target signal by numerical calculations are established.
Keywords :
bipolar transistors; magnetic sensors; semiconductor device models; sensitivity; control voltage; current sensitivity; dual-collector bipolar magnetosensitivity; electrodes; emitter-base-collector; magnetic sensitivity; magnetotransistor; microsystem; n-p-n transistor; numerical method; numerical modeling; target signal; CMOS process; Circuit topology; Electrodes; Ion implantation; Magnetic field measurement; Magnetic fields; Magnetic sensors; Numerical models; Semiconductor device modeling; Substrates; Microsystems; magnetosensitivity element; magnetotransistor; sensitivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Materials, 2007. EDM '07. 8th Siberian Russian Workshop and Tutorial on
Conference_Location :
Erlagol, Altai
ISSN :
1815-3712
Print_ISBN :
978-5-7782-0752-3
Type :
conf
DOI :
10.1109/SIBEDM.2007.4292921
Filename :
4292921
Link To Document :
بازگشت