Title :
Detection of defects in textures with alignment error for real-time line-scan web inspection systems
Author :
Baykal, I. Cem ; Jullien, G.A.
Author_Institution :
VLSI Res. Group, Windsor Univ., Ont., Canada
Abstract :
Hash functions are recently introduced as an extremely efficient method to calculate a measure of deficiency on repeating textures. These hash functions generate one dimensional signatures of patterns and they are simple enough to fit into a medium size FPGA. Although these functions are immune to change in illumination and contrast, they require the texture to be perfectly aligned. Any angular misalignment causes these functions to operate incorrectly. In this paper, a new family of hash function and a new signature analysis method are presented to overcome this problem.
Keywords :
adaptive filters; cryptography; field programmable gate arrays; image texture; inspection; pattern recognition; FPGA; adaptive filter; alignment errors; angular misalignment; binary signatures; checksum function; fabric inspection; film inspection; hash functions; line-scan web inspection systems; paper inspection; pattern 1D signatures; real-time inspection systems; repeating texture deficiency measure; signature analysis; texture alignment; texture defect detection; Cameras; Computer errors; Digital signal processing chips; Field programmable gate arrays; Hardware; Inspection; Lighting; Production; Real time systems; Very large scale integration;
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
DOI :
10.1109/MWSCAS.2002.1187030