Title :
Failure analysis of odd/even word-line failure to improve the endurance performance of a NAND Flash
Author :
Sun, Young ; Zhang, Mark ; Yu, Jossen ; Dong, Walden ; Chien, Wei-Ting Kary
Author_Institution :
Semicond. Manuf. Int. Corp., Shanghai, China
Abstract :
A full-flow failure analysis (FA) was introduced in this paper. From the FA, we resolved odd/ even word-line failure which lead to poor endurance performance of a NAND Flash. After removing this defect, the endurance performance of this NAND Flash is greatly enhanced.
Keywords :
NAND circuits; failure analysis; flash memories; NAND flash; full-flow failure analysis; odd-even word-line failure; Failure analysis;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
Conference_Location :
Suzhou, Jiangsu
Print_ISBN :
978-1-4244-3911-9
Electronic_ISBN :
1946-1542
DOI :
10.1109/IPFA.2009.5232715
