Title :
A novel learning control strategy for hysteresis and vibration of piezo-scanners
Author :
Zhang, Yudong ; Fang, Yongchun ; Dong, Xiaokun ; Zhou, Xianwei
Author_Institution :
Inst. of Robot. & Autom. Inf. Syst., Nankai Univ., Tianjin, China
Abstract :
Piezoelectric actuators have been widely utilized in micro/nano systems due to the high positioning resolution. A typical instance is piezo-scanners equipped in scanning probe microscopes (SPM) to implement nanoscale measurement and manipulation for various samples. However, the inherent hysteresis and structural vibration of a piezo-scanner largely limit its positioning accuracy and bandwidth, as a result, current SPM has to be operated under comparatively low frequency, which does not meet the requirements of the highly developing nanotechnology. In this paper, a novel learning control strategy is proposed to mitigate the effects of hysteresis and vibration, so that to enable a piezo-scanner to achieve good tracking for periodic trajectories. Lyapunov technique is utilized to analyze the performance of the control algorithm, which proves that it guarantees global stability for the closed-loop error system. A simulation example is included to demonstrate that the designed control law reduces the effects of vibration and hysteresis of piezo-scanners remarkably.
Keywords :
Lyapunov methods; closed loop systems; hysteresis; learning (artificial intelligence); micromechanical devices; nanotechnology; piezoelectric actuators; scanning probe microscopy; stability; vibrations; Lyapunov technique; closed loop error system; global stability; high positioning resolution; hysteresis; learning control strategy; micro system; nano system; nanotechnology; piezoelectric actuators; piezoscanners; scanning probe microscopes; structural vibration; Algorithm design and analysis; Bandwidth; Frequency; Hysteresis; Nanotechnology; Performance analysis; Piezoelectric actuators; Scanning probe microscopy; Trajectory; Vibration control;
Conference_Titel :
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3871-6
Electronic_ISBN :
0191-2216
DOI :
10.1109/CDC.2009.5399690