DocumentCode
3296475
Title
A review of IC fabrication design and assembly defects manifested as field failures in Air Force avionic equipment
Author
Green, Thomas J.
Author_Institution
Rome Air Dev. Center, Griffiss AFB, NY, USA
fYear
1988
fDate
12-14 Apr 1988
Firstpage
226
Lastpage
229
Abstract
In 1986, Rome Air Development Center (RADC) initiated a microcircuit and hybrid field return and failure analysis program. Data from that program along with case studies from each of the three major failure categories are presented. Emphasis is placed on microcircuit failures that were the result of design, fabrication and assembly defects. The purpose of the RADC work is to lay the groundwork for a US Department of Defense parts return and failure analysis program and to demonstrate the importance of analyzing field failures
Keywords
aircraft instrumentation; failure analysis; integrated circuit testing; Air Force avionic equipment; IC fabrication; Rome Air Development Center; assembly defects; design defects; fabrication defects; failure analysis; field failures; microcircuit failures; Aerospace electronics; Assembly; Circuits; Defense industry; Fabrication; Failure analysis; Feedback; Government; Microprocessors; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium 1988. 26th Annual Proceedings., International
Conference_Location
Monterey, CA
Type
conf
DOI
10.1109/RELPHY.1988.23454
Filename
23454
Link To Document