• DocumentCode
    3296475
  • Title

    A review of IC fabrication design and assembly defects manifested as field failures in Air Force avionic equipment

  • Author

    Green, Thomas J.

  • Author_Institution
    Rome Air Dev. Center, Griffiss AFB, NY, USA
  • fYear
    1988
  • fDate
    12-14 Apr 1988
  • Firstpage
    226
  • Lastpage
    229
  • Abstract
    In 1986, Rome Air Development Center (RADC) initiated a microcircuit and hybrid field return and failure analysis program. Data from that program along with case studies from each of the three major failure categories are presented. Emphasis is placed on microcircuit failures that were the result of design, fabrication and assembly defects. The purpose of the RADC work is to lay the groundwork for a US Department of Defense parts return and failure analysis program and to demonstrate the importance of analyzing field failures
  • Keywords
    aircraft instrumentation; failure analysis; integrated circuit testing; Air Force avionic equipment; IC fabrication; Rome Air Development Center; assembly defects; design defects; fabrication defects; failure analysis; field failures; microcircuit failures; Aerospace electronics; Assembly; Circuits; Defense industry; Fabrication; Failure analysis; Feedback; Government; Microprocessors; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium 1988. 26th Annual Proceedings., International
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/RELPHY.1988.23454
  • Filename
    23454