• DocumentCode
    3296484
  • Title

    High reliable Al-Si alloy/Si contacts by rapid thermal sintering

  • Author

    Umemura, Eiichi ; Onoda, Hiroshi ; Madokoro, Shoji

  • Author_Institution
    Oki Electr. Ind. Co. Ltd., Tokyo, Japan
  • fYear
    1988
  • fDate
    12-14 Apr 1988
  • Firstpage
    230
  • Lastpage
    233
  • Abstract
    Rapid thermal annealing technology has been applied to the sintering process for Al-Si alloy. Contact resistance was kept low by this technique, and low contact resistance was maintained even after postsintering heat treatment. The relationship between contact resistance and the number of Si nodules has been investigated. Si nodules and the Si at contact holes are considered to be precipitation nuclei for dissolved Si in Al-Si alloy. Precipitating Si is shared by Si nodules and contact holes after heat treatment. This model explains contact resistance change during heat treatments
  • Keywords
    aluminium alloys; contact resistance; incoherent light annealing; metallisation; reliability; silicon; silicon alloys; sintering; AlSi-Si; Si nodules; contact holes; contact resistance; high reliability; metallisation; postsintering heat treatment; precipitation nuclei; rapid thermal annealing; rapid thermal sintering; Contact resistance; Furnaces; Heat treatment; Inorganic materials; Maintenance; Metallization; Rapid thermal annealing; Rapid thermal processing; Resistance heating; Silicon alloys; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium 1988. 26th Annual Proceedings., International
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/RELPHY.1988.23455
  • Filename
    23455