DocumentCode
3296484
Title
High reliable Al-Si alloy/Si contacts by rapid thermal sintering
Author
Umemura, Eiichi ; Onoda, Hiroshi ; Madokoro, Shoji
Author_Institution
Oki Electr. Ind. Co. Ltd., Tokyo, Japan
fYear
1988
fDate
12-14 Apr 1988
Firstpage
230
Lastpage
233
Abstract
Rapid thermal annealing technology has been applied to the sintering process for Al-Si alloy. Contact resistance was kept low by this technique, and low contact resistance was maintained even after postsintering heat treatment. The relationship between contact resistance and the number of Si nodules has been investigated. Si nodules and the Si at contact holes are considered to be precipitation nuclei for dissolved Si in Al-Si alloy. Precipitating Si is shared by Si nodules and contact holes after heat treatment. This model explains contact resistance change during heat treatments
Keywords
aluminium alloys; contact resistance; incoherent light annealing; metallisation; reliability; silicon; silicon alloys; sintering; AlSi-Si; Si nodules; contact holes; contact resistance; high reliability; metallisation; postsintering heat treatment; precipitation nuclei; rapid thermal annealing; rapid thermal sintering; Contact resistance; Furnaces; Heat treatment; Inorganic materials; Maintenance; Metallization; Rapid thermal annealing; Rapid thermal processing; Resistance heating; Silicon alloys; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium 1988. 26th Annual Proceedings., International
Conference_Location
Monterey, CA
Type
conf
DOI
10.1109/RELPHY.1988.23455
Filename
23455
Link To Document