DocumentCode
3296590
Title
Modeling and simulation of 2 kV 50 A SiC MOSFET/JBS power modules
Author
Chen, Zheng ; Burgos, Rolando ; Boroyevich, Dushan ; Wang, Fred ; Leslie, Scott
Author_Institution
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA
fYear
2009
fDate
20-22 April 2009
Firstpage
393
Lastpage
399
Abstract
This paper presents a methodology for modeling the high-voltage silicon carbide (SiC) MOSFET/Junction-Barrier Schottky (JBS) diode power modules. The electrical model of an actual high-voltage SiC MOSFET/JBS module has been obtained using computer-aided electromagnetic analysis and verified through measurements. A circuit simulation model of a 2 kV, 5 A 4-H SiC MOSFET has also been built based on Hefner MOSFET model and the published experimental data. The device and package models are then combined together in the circuit simulation of a double-pulse test. The simulation results obtained provide good insight into the fast switching behavior and parametric dependencies of the paralleled SiC dice, which will aid in the module physical layout and gate driver design, as well as switching and conduction loss analysis.
Keywords
MOSFET; Schottky barriers; Schottky diodes; circuit simulation; circuit testing; semiconductor junctions; silicon compounds; HV MOSFET/junction-barrier Schottky diode power modules; Hefner MOSFET model; MOSFET/JBS power modules; SiC; circuit simulation model; computer-aided electromagnetic analysis; current 50 A; double-pulse test; voltage 2 kV; Circuit simulation; Circuit testing; Computational modeling; Electromagnetic analysis; Electromagnetic modeling; MOSFET circuits; Multichip modules; Power MOSFET; Schottky diodes; Silicon carbide;
fLanguage
English
Publisher
ieee
Conference_Titel
Electric Ship Technologies Symposium, 2009. ESTS 2009. IEEE
Conference_Location
Baltimore, MD
Print_ISBN
978-1-4244-3438-1
Electronic_ISBN
978-1-4244-3439-8
Type
conf
DOI
10.1109/ESTS.2009.4906542
Filename
4906542
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