• DocumentCode
    3296754
  • Title

    Time of flight coincidence timing calibration techniques using radioactive sources

  • Author

    Perkins, A.E. ; Werner, M. ; Kuhn, A. ; Surti, S. ; Muehllehner, G. ; Karp, J.S.

  • Author_Institution
    Philips Res., Briarcliff Manor, NY
  • Volume
    5
  • fYear
    2005
  • fDate
    23-29 Oct. 2005
  • Firstpage
    2488
  • Lastpage
    2491
  • Abstract
    The coincidence timing offset must be measured accurately and robustly in order to elicit the best performance for a time of flight (TOF) PET scanner. The proposed calibration methods involve measuring the timing differences between multiple coincidence line pairs. The absolute time biases for each pixel on the detector are assumed to be independent which greatly reduces the number of counts that are needed for a good estimate. It is not a requirement that each pixel on the detector be measured in coincidence with every other pixel on the detector, but that the coincidences involve a reasonably large number of different pixels on the opposite side. The intrinsic timing offset for each detector crystal pixel is unfolded by forming the average of the offset values of each crystal pixel with opposing pixels to average out crystal variations and photomultiplier (PMT) timing differences. In this work, a comparison is made of different timing calibration techniques using radioactive sources, specifically a rotating line source and a point source in a scattering block. The calibrations using the different methods are performed on a prototype TOF scanner and the results are presented
  • Keywords
    calibration; photomultipliers; positron emission tomography; absolute time biases; detector crystal pixel; multiple coincidence line pairs; photomultiplier; point source; radioactive sources; rotating line source; scattering block; time of flight PET scanner; time of flight coincidence timing calibration; timing differences; Calibration; Crystals; Detectors; Hardware; Light scattering; Photomultipliers; Positron emission tomography; Prototypes; Robustness; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2005 IEEE
  • Conference_Location
    Fajardo
  • ISSN
    1095-7863
  • Print_ISBN
    0-7803-9221-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2005.1596845
  • Filename
    1596845