• DocumentCode
    3296784
  • Title

    Characterizing metastability and jitter in CMOS latch/flip-flop used as a digital mixer

  • Author

    Shankar, I. ; Morris, S.A. ; Hutchens, C.G.

  • Author_Institution
    Sch. of Electr. & Comput. Sci. Eng., Oklahoma State Univ., Stillwater, OK, USA
  • Volume
    3
  • fYear
    2002
  • fDate
    4-7 Aug. 2002
  • Abstract
    A novel low power silicon-on-insulator (SOI) CMOS digital mixer circuit that is small, fully integrable and easily implemented is presented. This circuit is for use in a microbalance counter circuit (MBC) that operates at temperatures up to 180 degrees Celsius for petroleum industry well logging applications and has a measurement acquisition time of 2.4 seconds and a frequency resolution of 59 nHz when measuring 7 MHz signals. The digital mixer circuit eliminates the need for an analog mixer and bulky, temperature sensitive low pass filter components. This paper focuses on modeling and analysis of the metastable behavior and measurement inaccuracy caused by input phase jitter of the digital mixer. There is a risk of miscount due to jitter in the input signals. This paper explains how to model this risk and generate design parameters given the user´s criteria for maximum risk of count errors.
  • Keywords
    CMOS logic circuits; circuit stability; counting circuits; flip-flops; frequency measurement; integrated circuit design; jitter; logic design; low-power electronics; microbalances; mixers (circuits); silicon-on-insulator; 180 degC; 2.4 sec; 7 MHz; CMOS latch/flip-flop mixer; MBC; SOI; Si-SiO2; count errors; digital mixer; frequency measurement circuit; frequency resolution; input phase jitter; low power mixer; measurement acquisition time; measurement inaccuracy; metastability characterisation; microbalance counter circuit; miscount risk; petroleum industry; silicon-on-insulator; well logging measurement acquisition; CMOS digital integrated circuits; Counting circuits; Flip-flops; Frequency measurement; Jitter; Latches; Metastasis; Silicon on insulator technology; Temperature sensors; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
  • Print_ISBN
    0-7803-7523-8
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2002.1187098
  • Filename
    1187098