Title :
Tele-nanorobotics 2-d manipulation of micro/nanoparticles using afm
Author :
Sitti, Metin ; Horiguchi, Satoshi ; Hashimoto, Hideki
Author_Institution :
University of Tokyo, Japan
Keywords :
Atomic force microscopy; Computer displays; Fingers; Nanoparticles; Optical imaging; Optical scattering; Silicon; Topology; Transmission electron microscopy; Vibration measurement;
Conference_Titel :
Advanced Intelligent Mechatronics, 1999. Proceedings. 1999 IEEE/ASME International Conference on
Print_ISBN :
0-7803-5038-3
DOI :
10.1109/AIM.1999.803271
