Title :
Built-In Self-Test (BIST) in the era of deep sub-micron technology
Author :
Koenemann, Bernd ; Pateras, Stephen
Author_Institution :
Logic Vision, San Jose, CA, USA
Abstract :
Design for Test (DFT) techniques are becoming much more commonplace today than just a few years ago. In particular, Built-in Self-Test (BIST) techniques integrate elements of test equipment and interfacing functions into the device under test. BIST not only provides test capabilities, it also provides debug, burn-in, characterization, diagnosis, and many other useful functions. Proven BIST technology is available today. Users of BIST have found the technology useful and effective for many of today´s high-end designs. That is, BIST is not only a technology of the future, but a highly effective technology in use today
Keywords :
automatic testing; built-in self test; design for testability; integrated circuit testing; logic testing; BIST; DFT techniques; built-in self-test; deep submicron technology; design for test techniques; Acceleration; Automatic testing; Built-in self-test; Design automation; Design for testability; Electronic equipment testing; Logic testing; Microelectronics; Semiconductor device testing; Test equipment;
Conference_Titel :
Northcon/96
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-3277-6
DOI :
10.1109/NORTHC.1996.564944
