DocumentCode :
3298321
Title :
Joint feature distributions for image correspondence
Author :
Triggs, Bill
Author_Institution :
CNRS, Montbonnot, France
Volume :
2
fYear :
2001
fDate :
2001
Firstpage :
201
Abstract :
We introduce `Joint Feature Distributions´, a general statistical framework for feature based multi-image matching that explicitly models the joint probability distributions of corresponding features across several images. Conditioning on feature positions in some of the images gives well-localized distributions for their correspondents in the others, and hence tight likelihood regions for correspondence search. We apply the framework in the simplest case of Gaussian-like distributions over the direct sum (affine images) and tensor product (projective images) of the image coordinates. This produces probabilistic correspondence models that generalize the geometric multi-image matching constraints, roughly speaking by a form of model-averaging over them. These very simple methods predict accurate correspondence likelihood regions for any scene geometry including planar and near-planar scenes, without ill-conditioning or explicit model selection. Small amounts of distortion and non-rigidity are also tolerated. We develop the theory for any number of affine or projective images, explain its relationship to matching tensors, and give results for an initial implementation
Keywords :
feature extraction; image matching; Joint Feature Distributions; affine images; correspondence likelihood regions; correspondence search; image correspondence; image matching; multi-image matching; multi-image matching constraints; probabilistic correspondence models; projective images; scene geometry; tensor product; tight likelihood regions; Gaussian distribution; Information geometry; Layout; Predictive models; Probability distribution; Search problems; Solid modeling; Tensile stress; Training data; World Wide Web;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision, 2001. ICCV 2001. Proceedings. Eighth IEEE International Conference on
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7695-1143-0
Type :
conf
DOI :
10.1109/ICCV.2001.937625
Filename :
937625
Link To Document :
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