Title :
A Simplified Self-Checking Design of Multioutput Circuits
Author :
Chen, Tongzhao ; Su, Stephen Y H
Author_Institution :
Department of Computer Science, State University of New York
Keywords :
Circuit faults; Circuit testing; Integrated circuit testing; Logic arrays; Logic testing; Registers; Sequential analysis; System testing; Test pattern generators; Very large scale integration;
Conference_Titel :
Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE
DOI :
10.1109/STIER.1987.716763
