• DocumentCode
    3298460
  • Title

    Tip emitter structures fabricated with using the scanning tunneling microscope

  • Author

    Shkuratov, S.I. ; Dorofeev, I.A. ; Volgunov, D.I. ; Shilimanov, S.N.

  • Author_Institution
    Urals Div. of the Russian Acad. of Sci., Inst. of Electrophys., Ekaterinburg, Russia
  • fYear
    1996
  • fDate
    7-12 Jul 1996
  • Firstpage
    662
  • Abstract
    Summary form only given, as follows. Results are presented of investigations of the fabrication processes of tip emitter structures using the scanning tunneling microscope (STM). Nanostructures were fabricated on the surface of multilayer thin film carbon/Me structures (Me: Cr, Fe, Ni, Mo). The number of layers was varied from 3 to 100. Nanotips were formed as a result of pulsed current action from the STM needle to the substrate: in a selected spot on the surface of the specimen the feedback of the STM servo system is interrupted and a voltage pulse several tens of nanoseconds wide is applied to the tunneling gap. After that using the same needle one can get an STM image of the tip emitter. The possibility is shown of fabricating tip emitter structures consisting of hundreds of nanotips. Factors influencing the nanotip parameters were investigated: residual gas atmosphere, pulsed action modes, characteristics of STM needle, materials of multilayer structures. The tip formation mechanism is discussed
  • Keywords
    carbon; electron field emission; microscopy; nanotechnology; scanning tunnelling microscopy; vacuum microelectronics; C-Cr; C-Fe; C-Mo; C-Ni; STM needle; fabrication processes; scanning tunneling microscope; tip emitter structures; tip formation mechanism; Carbon dioxide; Chromium; Fabrication; Iron; Microscopy; Nanostructures; Needles; Nonhomogeneous media; Transistors; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
  • Conference_Location
    St. Petersburg
  • Print_ISBN
    0-7803-3594-5
  • Type

    conf

  • DOI
    10.1109/IVMC.1996.601921
  • Filename
    601921