• DocumentCode
    3298658
  • Title

    A New Built-in Self-test Approach For Digital-to-analog And Analog-to-digital Converters

  • Author

    Arabi, Karim ; Kaminska, Bozena ; Rzeszut, Janusz

  • fYear
    1994
  • fDate
    6-10 Nov 1994
  • Firstpage
    491
  • Lastpage
    494
  • Keywords
    Analog circuits; Analog-digital conversion; Automatic testing; Built-in self-test; CMOS technology; Circuit testing; Linearity; Logic testing; Test equipment; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1994., IEEE/ACM International Conference on
  • ISSN
    1063-6757
  • Print_ISBN
    0-8186-3010-8
  • Type

    conf

  • DOI
    10.1109/ICCAD.1994.629860
  • Filename
    629860
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3298658