Title :
An application-specific integrated circuit for positron emission tomography
Author :
Christian, J.F. ; Dokhale, P.A. ; Lawrence, W.G. ; Stapels, C.J. ; Augustine, F.L. ; Shah, K.S. ; Squillante, M.R.
Author_Institution :
Radiat. Monitoring Devices Inc., Watertown, MA
Abstract :
Improving the performance of positron-emission tomography (PET) systems for small animal imaging requires the use of high-speed detectors, such as a lutetium oxyorthosilicate (LSO) crystal coupled to avalanche photodiodes (APDs). We have developed an application-specific integrated circuit (ASIC) for reading out the multiple channels of an LSO-APD detector module for use in a small animal PET system. In this work, we characterize the performance of the ASIC, referred to as the AE172 chip. The AE172 can accommodate both positive and negative input signals, with a programmable conversion gain that ranges from 2.8 mV/fC to 21 mV/fC. The ASIC channels exhibit a linear response and an equivalent noise charge (ENC) of ~2000 electrons, RMS. The timing jitter depends on the amplitude of the input signal; and is less than 1 ns for test signals greater than 100,000 electrons. Connecting the ASIC to a linear APD detector reduces the relative readout noise to 26 electrons referenced to the input of the APD, which is operated at a gain of ~200. An LSO-APD-ASIC detector achieves an energy resolution of 13% for the 511 keV annihilation photons from a 22Na source, and a coincident timing resolution of ~13 ns
Keywords :
application specific integrated circuits; avalanche photodiodes; coincidence techniques; nuclear electronics; positron emission tomography; semiconductor counters; solid scintillation detectors; timing jitter; 22Na source; AE172 chip; LSO-APD-ASIC detector; application-specific integrated circuit; avalanche photodiodes; coincident timing resolution; equivalent noise charge; lutetium oxyorthosilicate crystal; positron emission tomography; small animal imaging; timing jitter; Animals; Application specific integrated circuits; Avalanche photodiodes; Coupling circuits; Detectors; Electrons; Energy resolution; Positron emission tomography; Testing; Timing jitter;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
Print_ISBN :
0-7803-9221-3
DOI :
10.1109/NSSMIC.2005.1596953