Title :
Characterization of a single photon counting imaging system by the transfer functions analysis
Author :
Bisogni, M.G. ; Carpentieri, C. ; Delogu, P. ; Fantacci, M.E. ; Novelli, M. ; Quattrocchi, M. ; Retico, A. ; Rosso, V. ; Stefanini, A.
Author_Institution :
Dipt. di Fisica, Pisa Univ.
Abstract :
A method to quantitatively evaluate the performances of a radiographic detection system consists on measuring the contrast, noise and modulation transfer functions. These functions have been evaluated for a digital radiographic system based on a single photon counting pixel detector. The X-ray detector is a silicon sensor with one side segmented in a matrix of 256 by 256 square contacts with a pitch of 55 mum. The active area is about 2 cm2. The sensor is connected to the Medipix2 read-out chip by bump-bonding. As X-ray source we used a tube for general radiography. To reproduce the conditions of a radiographic examination a 4 cm thick lucite block positioned above the detector has been used to simulate a tissue sample. To study the contrast transfer function we have measured the contrast of 1 mm thick lead slab with respect to the background. To evaluate the scattering contribution from the lucite, the measurements have been performed with and without a collimator placed at the beam exit. To assess the efficiency and noise transfer properties, we have measured the detective quantum efficiency (DQE) of the detector as a function of the tube voltage. The modulation transfer function has been measured applying the slit method for different conditions of tube voltage and energy threshold
Keywords :
X-ray apparatus; X-ray imaging; noise; nuclear electronics; optical transfer function; position sensitive particle detectors; radiography; readout electronics; silicon radiation detectors; 1 mm; 4 cm; 55 mum; Medipix2 read-out chip; X-ray detector; X-ray source; bump-bonding; contrast transfer function; detective quantum efficiency; digital radiographic detection system; lead slab; lucite block; modulation transfer function; noise transfer function; silicon sensor; single photon counting imaging system; single photon counting pixel detector; slit method; transfer functions analysis; tube voltage; Image analysis; Noise measurement; Optical imaging; Optoelectronic and photonic sensors; Performance evaluation; Radiography; Silicon; Thickness measurement; Transfer functions; X-ray detectors;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
Print_ISBN :
0-7803-9221-3
DOI :
10.1109/NSSMIC.2005.1596958