DocumentCode
3298777
Title
X-ray micro radiography using beam hardening correction
Author
Vavrik, Daniel ; Holy, Tomas ; Jakubek, Jan ; Pospisil, Stanislav ; Vykydal, Zdenek ; Dammer, Jiri
Author_Institution
Inst. of Theor. & Appl. Mech., Czech Acad. of Sci., Prague
Volume
5
fYear
2005
fDate
23-29 Oct. 2005
Firstpage
2989
Lastpage
2992
Abstract
The system presented provides high quality micro radiographs including very low contrast and low absorption objects. An important source of image distortion arises from beam hardening effects. When left uncorrected, distortion blurs low contrast image elements. Using a cooled digital X-ray semiconductor detector together with the proposed beam hardening correction procedure brings high dynamic range and very low noise of the acquired radiographs over the entire X-ray source spectrum. Both soft and hard parts of the object appear with high contrast and spatial resolution in the resulting radiographs. The beam hardening correction procedure is fully automated using a set of the calibrators and appropriate software modules
Keywords
X-ray apparatus; X-ray effects; radiography; semiconductor counters; X-ray microradiography; beam hardening correction; beam hardening effects; digital X-ray semiconductor detector; image distortion; Attenuation; Calibration; Dynamic range; Polynomials; Radiography; Semiconductor device noise; Spatial resolution; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location
Fajardo
ISSN
1095-7863
Print_ISBN
0-7803-9221-3
Type
conf
DOI
10.1109/NSSMIC.2005.1596959
Filename
1596959
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