Title : 
Performance of a large area Si PIN photodiode array
         
        
            Author : 
Orito, R. ; Nishimura, H. ; Hattori, K. ; Kubo, H. ; Miuchi, K. ; Nagayoshi, T. ; Okada, Y. ; Sekiya, Hiroo ; Takada, A. ; Takeda, A. ; Tanimori, T.
         
        
            Author_Institution : 
Dept. of Phys., Kobe Univ.
         
        
        
        
        
        
        
            Abstract : 
We have developed a 10 cm-square large-area Si PIN photodiode array (PDA) for a readout of a pixellated scintillator array. The 10 cm-square PDA consists of four 5 cm-square PDAs, each of which has 100 pixels with a pitch of 5 mm, and is aligned with no dead-space with each other. The structure of the PDA is based on the Hamamatsu S3590-08, which is a conventional Si PIN photodiode with an area of 1 cm-square. The cathode electrode is common, and anodes are read individually. We report the basic performance of the PDA; the quantum efficiency, leakage current, and detector capacitance. We measured X-ray spectra with radioisotopes, and evaluated the position dependence of the energy resolution. Coupling to the small CsI(Tl) scintillator bar, the gamma-ray spectrum was also measured, and the sufficient performance for a readout of CsI(Tl) scintillator was confirmed. The design and performance of the large-area PDA are reported
         
        
            Keywords : 
X-ray apparatus; gamma-ray apparatus; p-i-n photodiodes; position sensitive particle detectors; silicon radiation detectors; solid scintillation detectors; 1 cm; 10 cm; 5 cm; 5 mm; CsI(Tl) scintillator; Hamamatsu S3590-08; X-ray spectra; detector capacitance; gamma-ray spectrum; large area Si PIN photodiode array; leakage current; pixellated scintillator array; quantum efficiency; Anodes; Cathodes; Detectors; Electrodes; Energy measurement; Leak detection; Leakage current; PIN photodiodes; Position measurement; Quantum capacitance;
         
        
        
        
            Conference_Titel : 
Nuclear Science Symposium Conference Record, 2005 IEEE
         
        
            Conference_Location : 
Fajardo
         
        
        
            Print_ISBN : 
0-7803-9221-3
         
        
        
            DOI : 
10.1109/NSSMIC.2005.1596960