DocumentCode :
3299282
Title :
Thermal verification on FPGAs
Author :
Boemo, Eduardo ; López-Buedo, Sergio
Author_Institution :
Sch. of Eng., Univ. Autonoma de Madrid, Spain
fYear :
2005
fDate :
21-22 Nov. 2005
Firstpage :
48
Lastpage :
53
Abstract :
Thermal verification of complex ICs can help the designer to detect if a particular block is working beyond specifications. A simple method is to extract the output frequencies of an array of ring-oscillators previously distributed in the die. The main advantage is that neither external transducers nor analog parts are necessary. Other possibility is to bias one of the clamping diodes usually present in the pads, and measure its junction forward voltage. In both cases, the measurement of temperature can be done in actual working conditions; that is, with the chip inside the case with its heat sink and fan.
Keywords :
field programmable gate arrays; heat sinks; integrated circuit measurement; integrated circuit packaging; temperature measurement; FPGA; clamping diodes; complex integrated circuit; external transducers; heat sink; junction forward voltage; ring-oscillators; thermal verification; Clamps; Diodes; Employee welfare; Field programmable gate arrays; Frequency; Heat sinks; Semiconductor device measurement; Temperature measurement; Transducers; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
NORCHIP Conference, 2005. 23rd
Print_ISBN :
1-4244-0064-3
Type :
conf
DOI :
10.1109/NORCHP.2005.1596986
Filename :
1596986
Link To Document :
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