A test method and DFT structure for analog modules in mixed-signal circuits

Author

Al-Qutayri, M.A.

Volume

1

fYear

2002

fDate

4-7 Aug. 2002

Abstract

This paper outlines the difficulties associated with testing analog circuits in general and those residing within mixed-signal circuits in particular. It proposes a system level oriented tested method based on the excitation of the circuit-under-test with a pseudo random binary sequence and the subsequent analysis of the captured response. The fault detection capabilities of the test and data analysis methods are demonstrated by simulation results. The effect of the test sequence length on fault detection is studied. It also discusses a design for testability structure that can be incorporated in a mixed-signal chip to enable the testing of the analog circuit blocks.

Keywords

binary sequences; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; random sequences; DFT structure; analog circuit testing; data analysis; fault detection; mixed-signal circuit; pseudo-random binary sequence; Analog circuits; Binary sequences; Circuit simulation; Circuit testing; Design for testability; Digital circuits; Electrical fault detection; Electronic design automation and methodology; Filters; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on

Print_ISBN

0-7803-7523-8

Type

conf

DOI

10.1109/MWSCAS.2002.1187238

Filename

1187238