Title :
Review of IEEE P1149.4 mixed-signal test bus standard
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
This paper is a brief tutorial on the P1149.4 proposed standard. The motivation, operating procedure, and industry participation in the development of the standard will be briefly reviewed. The technical description of the analog boundary module and an example of the usage of the test bus to perform interconnect verification on board or MCM will be presented to show the test bus as an essential tool in system manufacturing test
Keywords :
IEEE standards; integrated circuit interconnections; integrated circuit testing; mixed analogue-digital integrated circuits; multichip modules; IEEE P1149.4 mixed-signal test bus standard; MCM; analog boundary module; circuit board; interconnect verification; system manufacturing; Built-in self-test; Circuit testing; Costs; Digital systems; Integrated circuit testing; Manufacturing; Sensor systems; Software standards; Standards development; System testing;
Conference_Titel :
Northcon/96
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-3277-6
DOI :
10.1109/NORTHC.1996.564951
