DocumentCode :
3299524
Title :
2.5 GHz pin electronics SiGe driver for IC test equipment
Author :
Goren, David ; Zelikson, Michael ; Leibowitz, Moshe ; Szenher, Frank
Author_Institution :
Res. Lab., IBM Corp., Haifa, Israel
fYear :
1999
fDate :
1999
Firstpage :
31
Lastpage :
33
Abstract :
The design and characterization of a 2.5 GHz pin electronic SiGe driver is reported. Measured performance includes: programmable output swing from 100 mV to 1.7 V into 25 Ω trise/tfall of 60 ps at full swing, propagation delay dispersion of 20 ps
Keywords :
Ge-Si alloys; UHF integrated circuits; UHF measurement; bipolar analogue integrated circuits; driver circuits; high-speed integrated circuits; integrated circuit testing; semiconductor materials; test equipment; 100 mV to 1.7 V; 2.5 GHz; IC test equipment; SiGe; SiGe driver; adaptive overshoot control; characterization; pin electronics driver; programmable output swing; Adaptive control; Current control; Driver circuits; Electronic equipment testing; Germanium silicon alloys; Programmable control; Propagation delay; Silicon germanium; Test equipment; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 1999. Proceedings of the 1999
Conference_Location :
Minneapolis, MN
ISSN :
1088-5714-0
Print_ISBN :
0-7803-5712-4
Type :
conf
DOI :
10.1109/BIPOL.1999.803519
Filename :
803519
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3299524
بازگشت