Title :
Influence of the oxygen flow rate on the plasma parameters in reactive magnetron sputtering plasma using Zn target
Author :
Nayan, Nafarizal ; Ali, Riyaz Ahmad Mohamed ; Mamat, Mohamad Hafiz ; Mahmood, Mohamad Rusop
Author_Institution :
Microelectron. & Nanotechnol. - Shamsuddin Res. Centre (MiNT-SRC), Univ. Tun Hussein Onn Malaysia, Batu Pahat, Malaysia
Abstract :
Aluminum-doped zinc oxide (AZO) and zinc oxide (ZnO) are promising materials which have been investigated for photovoltaic and photosensor applications. The applications of ZnO based thin films are due to several unique material properties where it is a II-IV semiconductor with a wide direct bandgap of 3.2 eV at room temperature, which is almost similar to titanium dioxide (TiO2) material. In many researches, ZnO based thin films have been grown by various deposition technique, such as sputtering, chemical bath deposition, pulsed laser deposition, and thermal chemical vapor deposition. In such options, the reactive sputtering technique using Zn metal target represents one of the simplest and most effective techniques which have been proposed by many researchers[1,2].
Keywords :
II-VI semiconductors; plasma deposition; semiconductor growth; semiconductor thin films; sputter deposition; wide band gap semiconductors; zinc compounds; II-IV semiconductor; Zn metal target; ZnO; ZnO based thin films; aluminum-doped zinc oxide; chemical bath deposition; deposition technique; material properties; oxygen flow rate; photosensor application; photovoltaic application; plasma parameters; pulsed laser deposition; reactive magnetron sputtering plasma; reactive sputtering technique; temperature 293 K to 298 K; thermal chemical vapor deposition; titanium dioxide material; wide direct bandgap; Argon; Discharges (electric); Fluid flow; Plasma temperature; Sputtering; Temperature measurement;
Conference_Titel :
Enabling Science and Nanotechnology (ESciNano), 2012 International Conference on
Conference_Location :
Johor Bahru
Print_ISBN :
978-1-4577-0799-5
DOI :
10.1109/ESciNano.2012.6149634