• DocumentCode
    3300246
  • Title

    Time-delay estimation: two comparative models for distributed on-chip RLC interconnects under ramp excitation

  • Author

    Coulibaly, L.M. ; Kadim, H.J.

  • Author_Institution
    Sch. of Eng., Liverpool JM Univ., UK
  • fYear
    2005
  • fDate
    21-22 Nov. 2005
  • Firstpage
    245
  • Lastpage
    248
  • Abstract
    In today´s very large scale integration (VLSI) circuits based on ultra deep submicron (DSM) process technology, on-chip interconnect plays a dominating role in determining the overall circuit performance, reliability and cost. On-chip interconnects are best modelled as a network of coupled lines. Hence, their delay estimation has to consider the effect of parasitic coupling between the lines, as the noise due to parasitic coupling between signal wires can result in functional failure or logic error by introducing delays into the circuit. If accurate interconnect delay estimation is to be achieved, modelling interconnects as a distributed RLC line is necessary. In this paper, we present two different closed-form analytical models for estimating the time-delay of a distributed RLC interconnect.
  • Keywords
    RLC circuits; VLSI; delays; integrated circuit interconnections; integrated circuit modelling; RLC interconnects; VLSI circuits; circuit noise; distributed RLC line; logic error; on-chip interconnects; parasitic coupling; ramp excitation; time-delay estimation; ultra deep submicron process technology; Circuit noise; Circuit optimization; Costs; Coupling circuits; Delay estimation; Integrated circuit interconnections; Integrated circuit reliability; Network-on-a-chip; RLC circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    NORCHIP Conference, 2005. 23rd
  • Print_ISBN
    1-4244-0064-3
  • Type

    conf

  • DOI
    10.1109/NORCHP.2005.1597035
  • Filename
    1597035