DocumentCode :
3300246
Title :
Time-delay estimation: two comparative models for distributed on-chip RLC interconnects under ramp excitation
Author :
Coulibaly, L.M. ; Kadim, H.J.
Author_Institution :
Sch. of Eng., Liverpool JM Univ., UK
fYear :
2005
fDate :
21-22 Nov. 2005
Firstpage :
245
Lastpage :
248
Abstract :
In today´s very large scale integration (VLSI) circuits based on ultra deep submicron (DSM) process technology, on-chip interconnect plays a dominating role in determining the overall circuit performance, reliability and cost. On-chip interconnects are best modelled as a network of coupled lines. Hence, their delay estimation has to consider the effect of parasitic coupling between the lines, as the noise due to parasitic coupling between signal wires can result in functional failure or logic error by introducing delays into the circuit. If accurate interconnect delay estimation is to be achieved, modelling interconnects as a distributed RLC line is necessary. In this paper, we present two different closed-form analytical models for estimating the time-delay of a distributed RLC interconnect.
Keywords :
RLC circuits; VLSI; delays; integrated circuit interconnections; integrated circuit modelling; RLC interconnects; VLSI circuits; circuit noise; distributed RLC line; logic error; on-chip interconnects; parasitic coupling; ramp excitation; time-delay estimation; ultra deep submicron process technology; Circuit noise; Circuit optimization; Costs; Coupling circuits; Delay estimation; Integrated circuit interconnections; Integrated circuit reliability; Network-on-a-chip; RLC circuits; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
NORCHIP Conference, 2005. 23rd
Print_ISBN :
1-4244-0064-3
Type :
conf
DOI :
10.1109/NORCHP.2005.1597035
Filename :
1597035
Link To Document :
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