Title :
Recent research and current issues in accelerated testing
Author :
Elsayed, E.A. ; Chen, Argon C K
Author_Institution :
Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA
Abstract :
We review the recent research and development in modeling accelerated life testing data obtained from a wide variety of test conditions. We also discuss the developments in the degradation modeling area. General reliability models that can be used to estimate reliability at normal operating conditions are presented. The limitations and disadvantages of the current models are reviewed
Keywords :
life testing; reliability theory; accelerated life testing; degradation model; reliability models; research and development; Acceleration; Degradation; Hazards; Life estimation; Life testing; Manufacturing; Performance evaluation; Predictive models; Reliability engineering; Stress;
Conference_Titel :
Systems, Man, and Cybernetics, 1998. 1998 IEEE International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-4778-1
DOI :
10.1109/ICSMC.1998.727595
