DocumentCode
3301371
Title
Compatibility of ferroelectric films in development of transmission lines for MMIC
Author
Ahmad, Rafidah ; Nadzar, Hanisah M. ; Sulaiman, Suhana ; Mohamad, Salina ; Rusop, M. ; Awang, Z.
Author_Institution
Microwave Technol. Centre, Univ. Teknol. MARA, Shah Alam, Malaysia
fYear
2012
fDate
5-7 Jan. 2012
Firstpage
1
Lastpage
2
Abstract
Ferroelectric materials offer promising features that are useful for microelectronic devices but they have not been popular for microwave integrated circuits due their preparation methods which are not compatible with integrated circuit manufacturing. In contrast, new dielectric materials are required for microwave integrated circuits (MIC) so that their performance is improved. Improved materials are needed to build transmission lines, which are basic building blocks in integrated circuit architecture. The main issues facing monolithic microwave integrated circuit (MMIC) technology today are power consumption and reliability. These are due to the high loss, poor resistivity and low permittivity dielectric materials used currently in MMIC [1]. There is therefore an urgent need to replace existing dielectrics with those that offer better high frequency response in terms of less loss, high resistivity and high permittivity. The main issues facing monolithic microwave integrated circuit (MMIC) technology today are power consumption and reliability. These are due to the high loss, poor resistivity and low permittivity dielectric materials used currently in MMIC [1, 2]. There is therefore an urgent need to replace existing dielectrics with those that offer better high frequency response in terms of less loss, high resistivity and high permittivity.
Keywords
MMIC; electrical resistivity; ferroelectric thin films; frequency response; lead compounds; magnesium compounds; permittivity; power consumption; transmission lines; zinc compounds; MMIC technology; MgZnO; PZT; electrical resistivity; ferroelectric films; frequency response; low permittivity dielectric materials; microelectronic devices; microwave integrated circuits; monolithic microwave integrated circuit technology; power consumption; reliability; transmission lines; Films; MMICs; Microwave circuits; Permittivity; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Enabling Science and Nanotechnology (ESciNano), 2012 International Conference on
Conference_Location
Johor Bahru
Print_ISBN
978-1-4577-0799-5
Type
conf
DOI
10.1109/ESciNano.2012.6149700
Filename
6149700
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