• DocumentCode
    3301371
  • Title

    Compatibility of ferroelectric films in development of transmission lines for MMIC

  • Author

    Ahmad, Rafidah ; Nadzar, Hanisah M. ; Sulaiman, Suhana ; Mohamad, Salina ; Rusop, M. ; Awang, Z.

  • Author_Institution
    Microwave Technol. Centre, Univ. Teknol. MARA, Shah Alam, Malaysia
  • fYear
    2012
  • fDate
    5-7 Jan. 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Ferroelectric materials offer promising features that are useful for microelectronic devices but they have not been popular for microwave integrated circuits due their preparation methods which are not compatible with integrated circuit manufacturing. In contrast, new dielectric materials are required for microwave integrated circuits (MIC) so that their performance is improved. Improved materials are needed to build transmission lines, which are basic building blocks in integrated circuit architecture. The main issues facing monolithic microwave integrated circuit (MMIC) technology today are power consumption and reliability. These are due to the high loss, poor resistivity and low permittivity dielectric materials used currently in MMIC [1]. There is therefore an urgent need to replace existing dielectrics with those that offer better high frequency response in terms of less loss, high resistivity and high permittivity. The main issues facing monolithic microwave integrated circuit (MMIC) technology today are power consumption and reliability. These are due to the high loss, poor resistivity and low permittivity dielectric materials used currently in MMIC [1, 2]. There is therefore an urgent need to replace existing dielectrics with those that offer better high frequency response in terms of less loss, high resistivity and high permittivity.
  • Keywords
    MMIC; electrical resistivity; ferroelectric thin films; frequency response; lead compounds; magnesium compounds; permittivity; power consumption; transmission lines; zinc compounds; MMIC technology; MgZnO; PZT; electrical resistivity; ferroelectric films; frequency response; low permittivity dielectric materials; microelectronic devices; microwave integrated circuits; monolithic microwave integrated circuit technology; power consumption; reliability; transmission lines; Films; MMICs; Microwave circuits; Permittivity; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Enabling Science and Nanotechnology (ESciNano), 2012 International Conference on
  • Conference_Location
    Johor Bahru
  • Print_ISBN
    978-1-4577-0799-5
  • Type

    conf

  • DOI
    10.1109/ESciNano.2012.6149700
  • Filename
    6149700