Title :
On-line BIST and diagnosis of FPGA interconnect using roving STARs
Author :
Stroud, Charles ; Lashinsky, Matthew ; Nall, Jeremy ; Emmert, John ; Abramovici, Miron
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina Univ., Charlotte, NC, USA
Abstract :
Presents the first on-line BIST and BIST-based diagnostic approach for the programmable interconnect resources in FPGAs. This interconnect BIST is used in the roving STARs approach. The technique provides a complete BIST of the programmable interconnect followed by high-resolution diagnostics to support reconfiguration around the fault for fault-tolerant applications. We have successfully implemented this BIST approach on the ORCA 2C series FPGA and present the results of testing and diagnosing known defective FPGAs
Keywords :
automatic testing; built-in self test; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit testing; logic testing; BIST-based diagnostic approach; FPGAs; ORCA 2C series; fault-tolerant applications; high-resolution diagnostics; known defective FPGAs; on-line BIST; partial run-time reconfiguration; programmable interconnect resources; roving STARs; self-testing area; Built-in self-test; Circuit faults; Fault detection; Fault tolerance; Field programmable gate arrays; Hardware; Integrated circuit interconnections; Logic testing; Routing; System testing;
Conference_Titel :
On-Line Testing Workshop, 2001. Proceedings. Seventh International
Conference_Location :
Taormina
Print_ISBN :
0-7695-1290-9
DOI :
10.1109/OLT.2001.937813
